Other articles related with "trap-assisted tunneling (TAT)":
37201 Xin Jiang(蒋鑫), Chen-Hao Li(李晨浩), Shuo-Xiong Yang(羊硕雄), Jia-Hao Liang(梁家豪), Long-Kun Lai(来龙坤), Qing-Yang Dong(董青杨), Wei Huang(黄威),Xin-Yu Liu(刘新宇), and Wei-Jun Luo(罗卫军)
  Reverse gate leakage mechanism of AlGaN/GaN HEMTs with Au-free gate
    Chin. Phys. B   2023 Vol.32 (3): 37201-037201 [Abstract] (284) [HTML 1 KB] [PDF 1115 KB] (240)
27701 Zhi Jiang(蒋 智), Yi-Qi Zhuang(庄奕琪), Cong Li(李 聪), Ping Wang(王 萍), Yu-Qi Liu(刘予琪)
  Influence of trap-assisted tunneling on trap-assisted tunneling current in double gate tunnel field-effect transistor
    Chin. Phys. B   2016 Vol.25 (2): 27701-027701 [Abstract] (764) [HTML 1 KB] [PDF 356 KB] (486)
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